World Scientific Publishing Company
Researchers have explored both volatile memories (eg, SRAM and embedded DRAM) and nonvolatile memories (NVMs, such as resistive RAM) for design of on-chip caches. However, both volatile and nonvolatile memories present unique reliability challenges. NVMs are immune to radiation-induced soft errors, however, due to their limited write endurance, they are vulnerable to hard errors under nonuniform write distribution. By contrast, SRAM has high write endurance but is susceptible to soft errors due to cosmic ...